Biodiversity Heritage Library
Subject "Transmission electron microscopes"
The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects / by Lawrence Joseph Sykes.
By: Sykes, Lawrence Joseph,
Publication info: 1981.
Contributed by: University of Florida, George A. Smathers Libraries
Subjects: Crystals Defects Dissertations, Academic Electron microscopy Materials Science and Engineering Materials Science and Engineering thesis Ph. D Transmission electron microscopes UF