The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects /
Add this to your Mendeley library Report an error

Title

The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects / by Lawrence Joseph Sykes.

By


Genre

Book

Publication info

1981.

Subjects

Crystals , Defects , Dissertations, Academic , Electron microscopy , Materials Science and Engineering , Materials Science and Engineering thesis Ph. D , Transmission electron microscopes , UF

DOI

http://dx.doi.org/10.5962/bhl.title.42486

Find in a local library

Title

The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects / by Lawrence Joseph Sykes.

By

Sykes, Lawrence Joseph,

Genre

Book

Publication info

1981.

Subjects

Crystals , Defects , Dissertations, Academic , Electron microscopy , Materials Science and Engineering , Materials Science and Engineering thesis Ph. D , Transmission electron microscopes , UF

Language

English

Identifiers:

OCLC: 8482591

DOI

http://dx.doi.org/10.5962/bhl.title.42486

Find in a local library

Download MODS

<mods xmlns:xlink="http://www.w3.org/1999/xlink" version="3.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.loc.gov/mods/v3" xsi:schemaLocation="http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-0.xsd">
<titleInfo>
<title>The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects / by Lawrence Joseph Sykes.</title>
</titleInfo>
<name type="personal">
<namePart>Sykes, Lawrence Joseph,</namePart>
<namePart type="date">1955-</namePart>
</name>
<typeOfResource>text</typeOfResource>
<genre authority="marcgt">book</genre>
<originInfo>
<dateIssued>1981.</dateIssued>
<dateIssued encoding="marc" point="start">1981</dateIssued>
</originInfo>
<language>
<languageTerm authority="iso639-2b" type="text">English</languageTerm>
</language>
<subject>
<topic>Crystals</topic>
</subject>
<subject>
<topic>Defects</topic>
</subject>
<subject>
<topic>Dissertations, Academic</topic>
</subject>
<subject>
<topic>Electron microscopy</topic>
</subject>
<subject>
<topic>Materials Science and Engineering</topic>
</subject>
<subject>
<topic>Materials Science and Engineering thesis Ph. D</topic>
</subject>
<subject>
<topic>Transmission electron microscopes</topic>
</subject>
<subject>
<geographic>UF</geographic>
</subject>
<identifier type="uri">http://www.biodiversitylibrary.org/bibliography/42486</identifier>
<identifier type="oclc">8482591</identifier>
<recordInfo>
<recordContentSource authority="marcorg">fug</recordContentSource>
</recordInfo>
</mods>

Download BibTeX citations

@book{bhl93013,
title = {The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects /},
url = {http://www.biodiversitylibrary.org/item/93013},
note = {http://www.biodiversitylibrary.org/bibliography/42486},
publisher = {},
author = {Sykes, Lawrence Joseph,},
year = {},
pages = {235},
keywords = {Crystals|Defects|Dissertations, Academic|Electron microscopy|Materials Science and Engineering|Materials Science and Engineering thesis Ph. D|Transmission electron microscopes|UF|},
}

Download EndNote citations

%0 Book
%A Sykes, Lawrence Joseph,
%D 1981
%T The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects / by Lawrence Joseph Sykes.
%! The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects /
%K Crystals
%K Defects
%K Dissertations, Academic
%K Electron microscopy
%K Materials Science and Engineering
%K Materials Science and Engineering thesis Ph. D
%K Transmission electron microscopes
%K UF
%G English
%U http://www.biodiversitylibrary.org/item/93013
%R 10.5962/bhl.title.42486